Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
(Sprache: Englisch)
This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
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This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Klappentext zu „Physical Principles of Electron Microscopy “
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Inhaltsverzeichnis zu „Physical Principles of Electron Microscopy “
- Dedication- Preface
- An Introduction to Microscopy
- Electron Optics
- The Transmission Electron Microscope
- TEM Specimens and Images
- The Scanning Electron Microscope
- Analytical Electron Microscopy
- Recent Developments
- Appendix: Mathematical Derivations
- The Schottky Effect
- Impact Parameter in Rutherford Scattering
- References
- Index.
Bibliographische Angaben
- Autor: R.F. Egerton
- 2011, 1st ed. 2005. Corr. 2nd printing 2011., 202 Seiten, Maße: 15,5 x 24,5 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 0387258000
- ISBN-13: 9780387258003
Sprache:
Englisch
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