Precision Nanometrology
Professor Wei Gao received his Bachelor degree in precision instrumentation engineering from Shanghai Jiao Tong University, China in 1986, followed by MS and PhD degrees in precision engineering from Tohoku University, Japan in 1991 and 1994, respectively. He is currently a professor and the director of the Research Center for Precision Nanosystems in the Department of Nanomechanics, Tohoku University. He acted as a visiting professor at the Center for Precision Metrology, University of North Carolina at Charlotte, USA, in 1998. He is an associate editor for Precision Engineering, Journal of the International Society for Precision Engineering and Nanotechnology. He has served as the chair or co-chair of six international conferences and symposiums on measurement held in China, Japan, Hong Kong and the US. He is a member of ASPE, JSPE, JSME and CIRP.
- Autor: Wei Gao
- 2010, 354 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 1849962537
- ISBN-13: 9781849962537
- Erscheinungsdatum: 28.06.2010
Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
---|
Schreiben Sie einen Kommentar zu "Precision Nanometrology".
Kommentar verfassen