Scanning Microscopy for Nanotechnology
Techniques and Applications
(Sprache: Englisch)
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is...
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Klappentext zu „Scanning Microscopy for Nanotechnology “
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Inhaltsverzeichnis zu „Scanning Microscopy for Nanotechnology “
Techniques- Fundamentals of Scanning Electron Microscopy (SEM).
- Low Voltage and High-resolution SEM.
- X-ray Microanalysis in Nanomaterials.
- Backscattering Detector and EBSD in Nanomaterials Characterization.
- Environmental Microscopy Application in Nanomaterials Research.
- E-beam Nanolithography Integrated with SEM.
- Focused Ion Beam Microscopy in Nanostructures Fabrication.
- Scanning Transmission Electron Microscopy (STEM) in Nanostructure Characterization. Applications
- Quantum Nanowires and Carbon Nanotubes.
- Photonic Crystals.
- Nanoparticles and Colloidal Nanocrystal Self-assembly.
- Nano-building Blocks Fabricated through Templates.
- Oxide Nanostructures.
- Biological & Bio-inspired Nanomaterials & Devices.
- Nano-manipulators in-situ Nanomaterials Engineering.
- Cryo- and High- Temperature Holder in Nanomaterials Research.
Bibliographische Angaben
- 2006, 2007, 522 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Herausgegeben:Zhou, Weilie; Wang, Zhong Lin
- Herausgegeben: Zhong Lin Wang, Weilie Zhou
- Verlag: Springer, New York
- ISBN-10: 0387333258
- ISBN-13: 9780387333250
- Erscheinungsdatum: 27.11.2006
Sprache:
Englisch
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