Scanning Probe Microscopy in Nanoscience and Nanotechnology
(Sprache: Englisch)
This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
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This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
Klappentext zu „Scanning Probe Microscopy in Nanoscience and Nanotechnology “
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
Inhaltsverzeichnis zu „Scanning Probe Microscopy in Nanoscience and Nanotechnology “
1. Dynamic Force Microscopy and Spectroscopy using the Frequency-Modulation Technique in Air and Liquids.- 2. Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- 3. Scanning Probe Alloying Nanolithography.- 4. Controlling Wear on Nanoscale.- 5. Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- 6. Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture.- 7. Near-field Nanolitography.- 8. Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- 9. Simultaneous Topography and Recognition Imaging.- 10. Application of Contact Mode AFM to Manufacturing Processes.- 11. Mechanical Properties of One-dimensional Nanostructures.- 12. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- 13. Force-extension (FX) and Force-clamp (FC) AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical properties of Single Biomolecules.- 14. Scanning Probe Microscopy as a Tool Applied to Agriculture.- 15. Spin Charge Pairing Instabilities, Magnetism and Ferroelectricity in Nanoclusters, High-Tc Cuprates, Manganites and Multiferroic Nanomaterials.- 16. Combining Atomic Force Microscopy and Depth Sensing Instruments for the Nanometre Scale Mechanical Characterization of Soft Matter.- 17. Structuring the Surface of Crystallizable Polymers with an AFM Tip.- 18. Polarization-sensitive Tip-enhanced Raman Scattering.- 19. Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- 20. Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- 21. Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- 22. A New AFM Based Lithography Method: ThermoChemical NanoLithography.- 23. Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- 24. Electrostatic Force Microscopy and
... mehr
Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- 25. Quantized Mechanics of Nanotubes and Bundles.- 26. Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.
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Bibliographische Angaben
- 2009, 956 Seiten, Maße: 16,7 x 24,6 cm, Gebunden, Englisch
- Herausgegeben:Bhushan, Bharat
- Herausgegeben: Bharat Bhushan
- Verlag: Springer
- ISBN-10: 3642035345
- ISBN-13: 9783642035340
- Erscheinungsdatum: 05.03.2010
Sprache:
Englisch
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