Scanning Probe Microscopy of Soft Matter
Fundamentals and Practices
(Sprache: Englisch)
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a...
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Produktinformationen zu „Scanning Probe Microscopy of Soft Matter “
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
Prof. Tsukruk is an internationally renowned leading expert in the field, and explains the topic in an easy-to-follow style.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research.
Prof. Tsukruk is an internationally renowned leading expert in the field, and explains the topic in an easy-to-follow style.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research.
Klappentext zu „Scanning Probe Microscopy of Soft Matter “
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:* Atomic Force Microscopy and Other Advanced Imaging Modes* Probing of Mechanical, Thermal Chemical and Electrical Properties* Amorphous, Poorly Ordered and Organized Polymeric Materials* Langmuir-Blodgett and Layer-by-Layer Structures* Multi-Component Polymer Systems and Fibers* Colloids and Microcapsules* Biomaterials and Biological Structures* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography* Microcantilever-Based Sensors
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
Prof. Tsukruk is an internationally renowned leading expert in the field, and explains the topic in an easy-to-follow style.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research.
Prof. Tsukruk is an internationally renowned leading expert in the field, and explains the topic in an easy-to-follow style.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research.
Inhaltsverzeichnis zu „Scanning Probe Microscopy of Soft Matter “
PART I: Microscopy FundamentalsINTRODUCTIONSCANNING PROBE MICROSCOPY BASICSBasic Principles of Scanning Probe MicroscopyScanning Tunneling MicroscopyAdvent of Atomic Force MicroscopyOverview of InstrumentationProbes and Cantilevers in Scanning Probe MicroscopyModes of OperationAdvantages and LimitationsBASICS FOR ATOMIC FORCE MICROSCOPY STUDIES OF SOFT MATTERPhysical Principles: Forces of InteractionImaging in Controlled EnvironmentArtifacts in AFM Imaging of Soft MaterialsSome Suggestions and Hints for Avoiding ArtifactsADVANCED IMAGING MODESSurface Force SpectroscopyFriction Force MicroscopyShear Modulation Force MicroscopyChemical Force MicroscopyPulsed-Force MicroscopyColloidal Probe MicroscopyScanning Thermal MicroscopyKelvin Probe and Electrostatic Force MicroscopyConductive Force MicroscopyMagnetic Force MicroscopyScanning Acoustic Force MicroscopyHigh-Speed Scanning Probe MicroscopyPART II: Probing Nanoscale Physical and Chemical PropertiesMECHANICAL PROPERTIES OF POLYMERS AND MACROMOLECULESElements of Contact Mechanics and Elastic ModulusProbing of Elastic Moduli for Different Materials: Selected ExamplesAdhesion MeasurementsVisoelasticity MeasurementsFrictionUnfolding of MacromoleculesPROBING OF MICROTHERMAL PROPERTIESIntroductionMeasurements of Glass TransitionMelting, Crystallization, and Liquid Crystalline Phase TransformationsThermal Expansion of MicrostructuresSurface Thermal ConductivityCHEMICAL AND ELECTRICAL PROPERTIESChemical InteractionsElectrochemical PropertiesWork Function and Surface PotentialConductivityMagnetic PropertiesSCANNING PROBE OPTICAL TECHNIQUESFundamental PrinciplesIntroduction to Scanning Near-Field Optical MicroscopyExamples of NSOM Studies of Polymers and Polymer BlendsMulticolor NSOM MeasurementsTip-Enhanced Raman Spectroscopy and MicroscopyAFM Tip-Enhanced FluorescenceIntegrating AFM with Fluorescence Optical MicroscopyIntegrating AFM with Confocal Raman MicroscopyPART III: Scanning Probe Techniques for Various Soft
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MaterialsAMORPHOUS AND POORLY ORDERED POLYMERSIntroductionGlassy Amorphous PolymersRubbersPolymer GelsInterpenetrating NetworksORGANIZED POLYMERIC MATERIALSCrystalline PolymersLiquid Crystalline Polymeric MaterialsPeriodic Polymeric StructuresHIGHLY BRANCHED MACROMOLECULESDendrimers and Dendritic MoleculesBrush MoleculesHyperbranched PolymersStar MoleculesHighly Branched NanoparticlesMULTICOMPONENT POLYMER SYSTEMS AND FIBERSPolymer BlendsBlock CopolymersPolymer NanocompositesPorous MembranesMicro- and NanofibersENGINEERED SURFACE AND INTERFACIAL MATERIALSBrush Polymer LayersSelf-Assembled MonolayersAdsorbed Macromolecules on Different SubstratesLANGMUIR-BLODGETT AND LAYER-BY-LAYER STRUCTURESLbL FilmsLangmuir-Blodgett FilmsCOLLOIDS AND MICROCAPSULESColloids and LatexesThin Shell MicrocapsulesReplicas and Anisotropic Template StructuresInterfacial Interactions Between Particles and SurfacesBIOMATERIALS AND BIOLOGICAL STRUCTURESImaging Adsorbed BiomacromoleculesProbing Specific Biomolecular InteractionsMechanics of Individual BiomacromoleculesSingle-Cell ElasticityLipid Bilayers as Cell Membrane MimicsPART IV: Nanomanipulation, Patterning, and SensingSCANNING PROBE MICROSCOPY ON PRACTICAL DEVICESElectrical SPM of Active Electronic and Optoelectronic DevicesMagnetic Force Microscopy of Storage DevicesNSOM of Electrooptical Devices and NanostructuresFriction Force Microscopy of Storage Media and MEMS DevicesNANOLITHOGRAPHY WITH INTRUSIVE AFM TIPIntroduction to AFM NanolithographyMechanical NanolithographyLocal Oxidative NanolithographyElectrostatic NanolithographyThermomechanical NanolithographyDIP-PEN NANOLITHOGRAPHYBasics of the Ink and Pen ApproachWriting with a Single PenSimultaneous Writing with Multiple Pens and Large-Scale DPNMICROCANTILEVER-BASED SENSORSBasic Modes of OperationThermal and Vapor SensingSensing in Liquid Environment
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Autoren-Porträt von Vladimir V. Tsukruk, Srikanth Singamaneni
Dr. Vladimir Tsukruk is a Professor in the School of Materials Science and Engineering and holds a joint appointment with the School of Polymer, Textile, and Fiber Engineering. Before joining Georgia Tech in July 2006, he was a Professor of Materials Science and Engineering at Iowa State University, Ames. He also served as Chair and Professor of Materials Science and Engineering in the College of Engineering & Applied Sciences at Western Michigan University from 1996-1999.Srikanth Singamaneni is currently a PhD student at Polymer Science and Engineering at Georgia Institute of Technology Atlanta, GA. He obtained a Master of Science degree in Electrical and Computer Engineering at Western Michigan University, Kalamazoo, in 2004. He completed his undergraduate studes and obtained a Bachelors of Technology in Electronics and Communication Engineering at Nagarjuna University, Bapatla, India in 2002.
Bibliographische Angaben
- Autoren: Vladimir V. Tsukruk , Srikanth Singamaneni
- 2011, XIX, 642 Seiten, 8 farbige Abbildungen, 285 Schwarz-Weiß-Abbildungen, Maße: 18 x 24,7 cm, Gebunden, Englisch
- Verlag: Wiley-VCH
- ISBN-10: 3527327436
- ISBN-13: 9783527327430
- Erscheinungsdatum: 22.11.2011
Sprache:
Englisch
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