Scott, J: Ferroelectric Memories
(Sprache: Englisch)
This is the first comprehensive book on ferroelectric memories which contains chapters on device design, processing, testing, and device physics, as well as on breakdown, leakage currents, switching mechanisms, and fatigue. State-of-the-art device designs...
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This is the first comprehensive book on ferroelectric memories which contains chapters on device design, processing, testing, and device physics, as well as on breakdown, leakage currents, switching mechanisms, and fatigue. State-of-the-art device designs are included and illustrated among the books many figures. More than 500 up-to-date references and 76 problems make it useful as a research reference for physicists, engineers and students.
Klappentext zu „Scott, J: Ferroelectric Memories “
This is the first comprehensive book on ferroelectric memories which contains chapters on device design, processing, testing, and device physics, as well as on breakdown, leakage currents, switching mechanisms, and fatigue. State-of-the-art device designs are included and illustrated among the books many figures. More than 500 up-to-date references and 76 problems make it useful as a research reference for physicists, engineers and students.
Inhaltsverzeichnis zu „Scott, J: Ferroelectric Memories “
- Fundamentals- Random Access Memories
- Electrical Breakdown
- Leakage Currents
- C(V) Data
- Switching Kinetics
- Fatigue and Charge Injection
- Frequency Dependence
- Phase Sequences on Processing
- SBT Structure
- Processing and Deposition
- Nondestructive READ-OUT Devices
- Phased Array Radar and 1-100 GHz Devices: Ferroelectric-on-superconductors
- Pyroelectrics and Wafer Bonding
- E-emission and Flat-panel Displays
- Optical Devices
- Nanophase Devices
- Limitations and Drawbacks
- Appendix: 100 Problems for Students
Bibliographische Angaben
- Autor: James F. Scott
- 2000, xvi, 248 Seiten, 95 Schwarz-Weiß-Abbildungen, Maße: 16,2 x 24 cm, Gebunden, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 3540663878
- ISBN-13: 9783540663874
- Erscheinungsdatum: 05.05.2000
Sprache:
Englisch
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