Transmission Electron Microscopy and Diffractometry of Materials
With numerous exercises
(Sprache: Englisch)
Designed to meet the needs of materials scientists, including students, teachers and researchers. It can be used as both an introductory and advanced level graduate text. Chapters are sorted according to difficulty and grouped for use in quarter and...
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Designed to meet the needs of materials scientists, including students, teachers and researchers. It can be used as both an introductory and advanced level graduate text. Chapters are sorted according to difficulty and grouped for use in quarter and semester courses. Problems for the student are appended to each chapter.
Klappentext zu „Transmission Electron Microscopy and Diffractometry of Materials “
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Inhaltsverzeichnis zu „Transmission Electron Microscopy and Diffractometry of Materials “
Diffraction and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.
Autoren-Porträt von Brent Fultz, James M. Howe
Professor James M. Howe is Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia (USA). He has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. He has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co-author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".
Bibliographische Angaben
- Autoren: Brent Fultz , James M. Howe
- 2007, 3rd ed., XVIII, 758 Seiten, 440 Abbildungen, Maße: 19,3 x 24,4 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 3540738851
- ISBN-13: 9783540738855
Sprache:
Englisch
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