Ultra-Low Voltage Nano-Scale Memories
(Sprache: Englisch)
The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. The authors share their knowledge and cover everything from the basics to the leading edge.
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The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. The authors share their knowledge and cover everything from the basics to the leading edge.
Klappentext zu „Ultra-Low Voltage Nano-Scale Memories “
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.
Inhaltsverzeichnis zu „Ultra-Low Voltage Nano-Scale Memories “
- An Introduction to LSI Design- Challenges and Trends of Low-Voltage Nano-Scale LSIs
- Leakage Reduction for RAMs
- Reduction of Performance Variations
- Reference Voltage Generators
- Voltage Down-Converters
- Voltage Up-Converters and Negative Voltage Generators
Bibliographische Angaben
- Autoren: Kiyoo Itoh , Masashi Horiguchi , Hitoshi Tanaka
- 2007, 360 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Herausgegeben: Kiyoo Itoh, Hitoshi Tanaka, Masashi Horiguchi
- Verlag: Springer US
- ISBN-10: 0387333983
- ISBN-13: 9780387333984
- Erscheinungsdatum: 22.08.2007
Sprache:
Englisch
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