VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
(Sprache: Englisch)
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The...
The 63 full papers were carefully reviewed and selected from 199 submissions. The...
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Klappentext zu „VLSI Design and Test “
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Inhaltsverzeichnis zu „VLSI Design and Test “
Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.
Bibliographische Angaben
- 2019, 1st ed. 2019, XVI, 775 Seiten, 336 farbige Abbildungen, Maße: 23,5 x 23,4 cm, Kartoniert (TB), Englisch
- Herausgegeben: Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
- Verlag: Springer, Berlin
- ISBN-10: 9813297662
- ISBN-13: 9789813297661
Sprache:
Englisch
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