X-Ray Scattering from Soft-Matter Thin Films
Materials Science and Basic Research
(Sprache: Englisch)
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and...
Voraussichtlich lieferbar in 3 Tag(en)
versandkostenfrei
Buch (Kartoniert)
106.99 €
53 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „X-Ray Scattering from Soft-Matter Thin Films “
Klappentext zu „X-Ray Scattering from Soft-Matter Thin Films “
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Inhaltsverzeichnis zu „X-Ray Scattering from Soft-Matter Thin Films “
Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.
Autoren-Porträt von Metin Tolan
Metin Tolan, 1965 als Sohn deutsch-türkischer Eltern in Oldenburg geboren, ist er seit 2001 Professor für Experimentelle Physikan der Technischen Universität Dortmund. Seine Leidenschaften sind Physik, Fußball und James-Bond-Filme. Die Vorträge, die er über diese aufregende Mischung hält, werden vom Publikum gefeiert.
Bibliographische Angaben
- Autor: Metin Tolan
- 2013, Softcover reprint of the original 1st ed. 1999, IX, 198 Seiten, Maße: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 366214218X
- ISBN-13: 9783662142189
Sprache:
Englisch
Rezension zu „X-Ray Scattering from Soft-Matter Thin Films “
"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."Physics Today, 2000/2
Pressezitat
"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."Physics Today, 2000/2
Kommentar zu "X-Ray Scattering from Soft-Matter Thin Films"
0 Gebrauchte Artikel zu „X-Ray Scattering from Soft-Matter Thin Films“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "X-Ray Scattering from Soft-Matter Thin Films".
Kommentar verfassen