Digital Holography for MEMS and Microsystem Metrology (PDF)
(Sprache: Englisch)
Approaching the topic of digital holography from the practical
perspective of industrial inspection, Digital Holography for
MEMS and Microsystem Metrology describes the process of
digital holography and its growing applications for...
perspective of industrial inspection, Digital Holography for
MEMS and Microsystem Metrology describes the process of
digital holography and its growing applications for...
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Approaching the topic of digital holography from the practical
perspective of industrial inspection, Digital Holography for
MEMS and Microsystem Metrology describes the process of
digital holography and its growing applications for MEMS
characterization, residual stress measurement, design and
evaluation, and device testing and inspection. Asundi also provides
a thorough theoretical grounding that enables the reader to
understand basic concepts and thus identify areas where this
technique can be adopted. This combination of both practical and
theoretical approach will ensure the book's relevance and appeal to
both researchers and engineers keen to evaluate the potential of
digital holography for integration into their existing machines and
processes.
* Addresses particle characterization where digital holography
has proven capability for dynamic measurement of particles in 3D
for sizing and shape characterization, with applications in
microfluidics as well as crystallization and aerosol detection
studies.
* Discusses digital reflection holography, digital transmission
holography, digital in-line holography, and digital holographic
tomography and applications.
* Covers other applications including micro-optical and
diffractive optical systems and the testing of these components,
and bio-imaging.
perspective of industrial inspection, Digital Holography for
MEMS and Microsystem Metrology describes the process of
digital holography and its growing applications for MEMS
characterization, residual stress measurement, design and
evaluation, and device testing and inspection. Asundi also provides
a thorough theoretical grounding that enables the reader to
understand basic concepts and thus identify areas where this
technique can be adopted. This combination of both practical and
theoretical approach will ensure the book's relevance and appeal to
both researchers and engineers keen to evaluate the potential of
digital holography for integration into their existing machines and
processes.
* Addresses particle characterization where digital holography
has proven capability for dynamic measurement of particles in 3D
for sizing and shape characterization, with applications in
microfluidics as well as crystallization and aerosol detection
studies.
* Discusses digital reflection holography, digital transmission
holography, digital in-line holography, and digital holographic
tomography and applications.
* Covers other applications including micro-optical and
diffractive optical systems and the testing of these components,
and bio-imaging.
Autoren-Porträt von Anand Asundi
Anand Asundi, Nanyang Technological University, SingaporeAnand Asundi is Professor and Deputy Director of the Advanced
Materials Research Centre at Nanyang Technological University in
Singapore. His research interests are in photomechanics and optical
sensors & he has published over 200 papers in peer-reviewed
journals and presented invited and plenary talks at international
conferences. He has also chaired and organized numerous conferences
in Singapore and other parts of the world.
He is Editor of Optics and Lasers in Engineering and on the
Board of Directors of SPIE, and a fellow of the Institute of
Engineers, Singapore and SPIE. He also holds advisory professorial
appointments at Tongji University, Shanghai University and Harbin
Institute of Technology, China. He is Chairman of the Asian
Committee on Experimental Mechanics and the Asia Pacific Committee
on Smart and Nano Materials both of which he co-founded.
Bibliographische Angaben
- Autor: Anand Asundi
- 2011, 1. Auflage, 232 Seiten, Englisch
- Verlag: John Wiley & Sons
- ISBN-10: 1119997305
- ISBN-13: 9781119997306
- Erscheinungsdatum: 20.06.2011
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