Electromagnetic Wave Scattering from Random Rough Surfaces (PDF)
Asymptotic Models
(Sprache: Englisch)
Electromagnetic wave scattering from random rough surfaces is an
active, interdisciplinary area of research with myriad practical
applications in fields such as optics, acoustics, geoscience and
remote sensing.
Focusing on the case of random rough...
active, interdisciplinary area of research with myriad practical
applications in fields such as optics, acoustics, geoscience and
remote sensing.
Focusing on the case of random rough...
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Electromagnetic wave scattering from random rough surfaces is an
active, interdisciplinary area of research with myriad practical
applications in fields such as optics, acoustics, geoscience and
remote sensing.
Focusing on the case of random rough surfaces, this book presents
classical asymptotic models used to describe electromagnetic wave
scattering. The authors begin by outlining the basic concepts
relevant to the topic before moving on to look at the derivation of
the scattered field under asymptotic models, based on the
Kirchhoff-tangent plane, in order to calculate both the scattered
field and the statistical average intensity.
More elaborated asymptotic models are also described for dealing
with specific cases, and numerical results are presented to
illustrate these models. Comparisons with a reference numerical
method are made to confirm and refine the theoretical validity
domains.
The final chapter derives the expressions of the scattering
intensities of random rough surfaces under the asymptotic models.
Its expressions are given for their incoherent contributions, from
statistical calculations. These results are then compared with
numerical computations using a Monte-Carlo process, as well as with
experimental models, for sea surface backscattering.
Contents
1. Electromagnetic Wave Scattering from Random Rough Surfaces:
Basics.
2. Derivation of the Scattered Field under Asymptotic Models.
3. Derivation of the Normalized Radar Cross-Section under
Asymptotic Models.
APPENDIX 1. Far-Field Scattered Fields under the Method of
Stationary Phase.
APPENDIX 2. Calculation of the Scattering Coefficients under the GO
for 3D Problems.
About the Authors
Nicolas Pinel worked as a Research Engineer at the IETR
(Institut d'Electronique et de Télécommunications
de Rennes) laboratory at Polytech Nantes (University of Nantes,
France) before joining Alyotech Technologies in Rennes, France, in
July 2013. His research interests are in the areas of radar and
optical remote sensing, scattering and propagation. In particular,
he works on asymptotic methods of electromagnetic wave scattering
from random rough surfaces and layers.
Christophe Bourlier works at the IETR (Institut
d'Electronique et de Télécommunications de Rennes)
laboratory at Polytech Nantes (University of Nantes, France) and is
also a Researcher at the French National Center for Scientific
Research (CNRS) on electromagnetic wave scattering from rough
surfaces and objects for remote sensing applications and radar
signatures. He is the author of more than 160 journal articles and
conference papers.
active, interdisciplinary area of research with myriad practical
applications in fields such as optics, acoustics, geoscience and
remote sensing.
Focusing on the case of random rough surfaces, this book presents
classical asymptotic models used to describe electromagnetic wave
scattering. The authors begin by outlining the basic concepts
relevant to the topic before moving on to look at the derivation of
the scattered field under asymptotic models, based on the
Kirchhoff-tangent plane, in order to calculate both the scattered
field and the statistical average intensity.
More elaborated asymptotic models are also described for dealing
with specific cases, and numerical results are presented to
illustrate these models. Comparisons with a reference numerical
method are made to confirm and refine the theoretical validity
domains.
The final chapter derives the expressions of the scattering
intensities of random rough surfaces under the asymptotic models.
Its expressions are given for their incoherent contributions, from
statistical calculations. These results are then compared with
numerical computations using a Monte-Carlo process, as well as with
experimental models, for sea surface backscattering.
Contents
1. Electromagnetic Wave Scattering from Random Rough Surfaces:
Basics.
2. Derivation of the Scattered Field under Asymptotic Models.
3. Derivation of the Normalized Radar Cross-Section under
Asymptotic Models.
APPENDIX 1. Far-Field Scattered Fields under the Method of
Stationary Phase.
APPENDIX 2. Calculation of the Scattering Coefficients under the GO
for 3D Problems.
About the Authors
Nicolas Pinel worked as a Research Engineer at the IETR
(Institut d'Electronique et de Télécommunications
de Rennes) laboratory at Polytech Nantes (University of Nantes,
France) before joining Alyotech Technologies in Rennes, France, in
July 2013. His research interests are in the areas of radar and
optical remote sensing, scattering and propagation. In particular,
he works on asymptotic methods of electromagnetic wave scattering
from random rough surfaces and layers.
Christophe Bourlier works at the IETR (Institut
d'Electronique et de Télécommunications de Rennes)
laboratory at Polytech Nantes (University of Nantes, France) and is
also a Researcher at the French National Center for Scientific
Research (CNRS) on electromagnetic wave scattering from rough
surfaces and objects for remote sensing applications and radar
signatures. He is the author of more than 160 journal articles and
conference papers.
Autoren-Porträt von Nicolas Pinel, Christophe Boulier
Dr. Nicolas Pinel is PhD in the Radar team of IREENA Laboratory at University of? Nantes Angers Le Mans, France.Christophe Bourlier is works at IREENA (Institut de Recherche en Electrotechnique et Electronique de Nantes Atlantique, France) Laboratory, University of Nantes, France.
Bibliographische Angaben
- Autoren: Nicolas Pinel , Christophe Boulier
- 2013, 1. Auflage, 266 Seiten, Englisch
- Verlag: John Wiley & Sons
- ISBN-10: 1118579496
- ISBN-13: 9781118579497
- Erscheinungsdatum: 04.12.2013
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