Iris Analysis for Biometric Recognition Systems / SpringerBriefs in Applied Sciences and Technology (PDF)
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The book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides detailed analysis of iris images and two methods of iris segmentation. It also discusses simplified study of some subspace-based methods and distance measures for iris recognition backed by empirical studies and statistical success verifications.
Sanjay N. Talbar is a Professor in the Department of Electronics and Telecommunication Engineering, Shri Guru Gobind Singhji Institute of Engineering and Technology, Nanded, India. He received B.E. and M.E. degrees from SGGS Institute of Technology, Nanded, India in 1985 and 1990, respectively. He obtained his PhD from SRTM University, Nanded, India in 2000. He received the "Young Scientist Award" by URSI, Italy in 2003. He has published 10 books, 50+ papers in refereed Journals and more than 120 papers in National and International Conferences. He has guided about 70 students for dissertation at M.E./M.Tech. and supervised 10 students for PhD and additional research scholars are working towards their PhD. He is a member of various prestigious academic committees. He is a member of IET (UK), life member of Indian Society for Technical Education (ISTE) and
- Autoren: Rajesh M. Bodade , Sanjay N. Talbar
- 2014, 2014, 109 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 8132218531
- ISBN-13: 9788132218531
- Erscheinungsdatum: 07.05.2014
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- Größe: 5.99 MB
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