Long-Term Reliability of Nanometer VLSI Systems (PDF)

professor at VLSI Design and Education Center (VDEC), University of Tokyo, Japan. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA, in the area of advanced computer-aided research, engaged in reliability issues in deep-submicrometer mixed-signal very large-scale integration (VLSI) designs. He holds several pending and granted U.S. and international patents. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology. His current research interests include nanocomputing, reliable computing, VLSI testing, reconfigurable computing, emerging nanotechnologies, and systems biology. Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award. He has been a program committee member, organizing committee member, track and topic chair, as well as workshop, panel, and special session organizer of various conferences and symposia in the areas of VLSI design automation, testing, reliability, and emerging nanotechnologies, such as ITC, VTS, DAC, ICCAD, DATE, ETS, ICCD, ASP-DAC, GLSVLSI, and VLSI Design. He is currently an associate editor for IEEE Design and Test Magazine (D&T), coordinating editor for Springer Journal of Electronic Testing (JETTA), associate editor of VLSI Integration Journal, and associate editor of IET Computers and Digital Techniques.

He was an associate editor of ACM Journal of Emerging Technologies for Computing. He received a number of best paper nominations and awards at various conferences and journals, including ICCAD 2015 and TODAES 2017. He is the Chair of the ACM SIGDA Technical Committee on Test and Reliability.









Taeyoung Kim has received his B.S. degree in electronics engineering from Konkuk University, Seoul, Korea in 2005, the M.S. degree in electrical engineering from University of Virginia, Charlottesville, VA, USA in 2012, and the Ph.D. degree in computer science from University of California, Riverside, CA, USA in 2017. He is currently a senior-level software engineer at Intel Corporation, in Hillsboro, Oregon. Also, he is currently an associate editor for Integration, the VLSI Journal.







Shengcheng Wang has received his B.S. degree in microelectronics from Nankai University, Tianjin, China in 2007, the M.S. degree in microelectronics from Peking University, Beijing, China in 2010, and the Ph.D. degree in computer science from Karlsruhe Institute of Technology, Karlsruhe, Germany in 2018. He is currently a research scientist at Agency for Science, Technology and Research (A*STAR) Institute of Microelectronics (IME), Singapore.







Zeyu Sun has received his B.S. degree in Electronic and Computer Engineering at Hong Kong University of Science and Technology (HKUST) in 2015. He is currently a Ph.D. student in the Department of Electrical and Computer Engineering at the University of California, Riverside.