Modeling Nanoscale Imaging in Electron Microscopy / Nanostructure Science and Technology (PDF)
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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing
Wolfgang Dahmen is a professor at RWTH Aachen.
Peter G. Binev is a Professor of Mathematics at the University of South Carolina.
- 2012, 2012, 182 Seiten, Englisch
- Herausgegeben: Thomas Vogt, Wolfgang Dahmen, Peter Binev
- Verlag: Springer-Verlag GmbH
- ISBN-10: 1461421918
- ISBN-13: 9781461421917
- Erscheinungsdatum: 02.03.2012
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- Größe: 6.72 MB
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“In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. … That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy.” (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)
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