5€¹ Rabatt bei Bestellungen per App

Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices / Springer Proceedings in Physics Bd.79 (PDF)

Proceedings of a Symposium Organized Along with the International Conference on Nonlinear Dynamics and Pattern Formation in the Natural Environment Noordwijkerhout, The Netherlands, July 4-7, 1994 (Sprache: Englisch)
 
 
%
Merken
%
Merken
 
 
Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices is concerned with fundamental processes of self-organization and electrical instabilities to show the correlations between them. Leading experts give a survey of recent experimental...
sofort als Download lieferbar

Bestellnummer: 105027635

Printausgabe 106.99 €
eBook (pdf) -10% 96.29
Download bestellen
Verschenken

DeutschlandCard 48 DeutschlandCard Punkte sammeln

 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
Kommentar zu "Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices / Springer Proceedings in Physics Bd.79"
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
0 Gebrauchte Artikel zu „Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices / Springer Proceedings in Physics Bd.79“
Zustand Preis Porto Zahlung Verkäufer Rating