Selective Maintenance Modelling and Optimization / Springer Series in Reliability Engineering (PDF)

Dr. Yu Liu is a Full Professor of Industrial Engineering with the School of Mechanical and Electrical Engineering at the University of Electronic Science and Technology of China. He received his Ph.D. degree in Mechatronics Engineering from the University of Electronic Science and Technology of China. He was a Visiting Pre-doctoral Fellow in the Department of Mechanical Engineering at Northwestern University, USA, from 2008 to 2010, and a Postdoctoral Research Fellow in the Department of Mechanical Engineering at the University of Alberta, Canada, from 2012 to 2013. He has published over 70 peer-reviewed papers in international journals. His research interests include system reliability modelling and analysis, maintenance optimization, prognostics and health management, and design under uncertainty. Prof. Liu has been recognized as one of the Most Cited Chinese Researchers by Elsevier since 2016. He was a recipient of the National Science Fund for Excellent Young Scholars. He has served as the Vice President of the Reliability Committee of Operations Research Society of China since 2022. He is an ISEAM Fellow and an Associate Editor of IISE Transactions and IEEE Transactions on Reliability.




Dr. Hong-Zhong Huang is a Full Professor of Mechanical Engineering with the School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China. He is also Director of the Center for System Reliability and Safety, at the University of Electronic Science and Technology of China. He has held visiting appointments at several universities in the USA, Canada, and Asia. He has authored or co-authored more than 350 journal papers and eight books in the fields of reliability engineering, optimization design, fuzzy sets theory, and product development. Prof. Huang is an ISEAM Fellow, Technical Committee Member of ESRA, Co-Editor-in-Chief for the International Journal of Reliability and Applications, and Editorial