Surface and Thin Film Analysis (ePub)
A Compendium of Principles, Instrumentation, and Applications
(Sprache: Englisch)
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated...
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Produktinformationen zu „Surface and Thin Film Analysis (ePub)“
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Inhaltsverzeichnis zu „Surface and Thin Film Analysis (ePub)“
INTRODUCTION ELECTRON DETECTION Photoelectron Spectroscopy (XPS, UPS) Auger Electron Spectroscopy (AES, SAM) Electron Energy Loss Spectroscopy (EELS) Low-energy Electron Diffraction (LEED) ION DETECTION Static Secondary Ion Mass Spectrometry (SSIMS) Dynamic Secondary Ion Mass Spectrometry (SIMS) Electron Beam and HF-Plasma Secondary Neutral Mass Spectrometry (SNMS) Laser-SNMS Rutherford Backscattering Spectroscopy (RBS) Low Energy Ion Scattering (LEIS) Nuclear Reaction Analysis (NRA) PHOTON DETECTION Total Reflection X-Ray Fluorescence Analysis (TXRF) Energy-dispersive X-ray Spectroscopy (EDXS) Grazing Incidence X-Ray Methods for Near-surface Structural Studies Glow Discharge Optical Emission Spectroscopy (GD-OES) Surface Analysis by Laser Ablation Ion Beam Spectrochemical Analysis (IBSCA) Reflection Absorption IR Spectroscopy (RAIRS) Surface-enhanced Raman Scattering (SERS) UV/VIS/IR Ellipsometry (ELL) SCANNING MICROSCOPY Atomic Force Microscopy (AFM) Scanning Tunneling Microscopy (STM) MISCELLANEOUS LEEM TXRF-NEXAFS GIXRF-NEXAFS SNOM EF-TEM SFG SHG FIM/AP SUMMARY AND COMPARISON OF TECHNIQUES SURFACE ANALYTICAL EQUIPMENT SUPPLIERS REFERENCES
Autoren-Porträt
Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. His research activities are focused on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis covering a broad field of applications ranging from basic research on thin film systems to materials science. Over the last decades he has held numerous theoretical and practical courses in the field of analytical chemistry with emphasis on intstrumental analysis and surface- and interface analysis. Prof. Friedbacher has published over 120 research articles, reviews, and book chapters.Henning Bubert worked at the Institut für Analytische Wissenschaften - ISAS - (Institute for Analytical Sciences) in Dortmund until his retirement in 2003. He is currently working as guest scientist. His research activities are mainly focused on investigation of surfaces and thin films by electron spectroscopy related to the development and application of new materials in mechanical engineering. He has published over 110 research articles, reviews, and book chapters.
Bibliographische Angaben
- 2011, 2. vollständig überarbeitete und erweiterte Auflage, 534 Seiten, Englisch
- Herausgegeben: Gernot Friedbacher, Henning Bubert
- Verlag: Wiley-VCH
- ISBN-10: 3527636935
- ISBN-13: 9783527636938
- Erscheinungsdatum: 14.04.2011
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eBook Informationen
- Dateiformat: ePub
- Größe: 14 MB
- Mit Kopierschutz
Sprache:
Englisch
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